
Investment sharpens process control from materials development through manufacturing


Qnity Electronics, Inc. (&#34;Qnity&#34;) (NYSE:Q), a premier technology solutions leader across the semiconductor value chain,

<p xmlns="http://www.w3.org/1999/xhtml" class="bwalignc">
<i xmlns="http://www.w3.org/1999/xhtml">Investment sharpens process control from materials development through manufacturing</i>

</p><p xmlns="http://www.w3.org/1999/xhtml">
Qnity Electronics, Inc. ("Qnity") (NYSE:<a class="ticker" href="https://www.benzinga.com/quote/Q">Q</a>), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#39;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps.

</p><p xmlns="http://www.w3.org/1999/xhtml" id="news-body-cta">This press release features multimedia. View the full release here: <a xmlns="http://www.w3.org/1999/xhtml" href="https://www.businesswire.com/news/home/20260819307953/en/" rel="nofollow">https://www.businesswire.com/news/home/20260819307953/en/</a></p><div xmlns="http://www.w3.org/1999/xhtml" id="bwbodyimg" style="width: 480px; float:left; padding-left:0px; padding-right:20px; padding-top:0px; padding-bottom:0px;"><img xmlns="http://www.w3.org/1999/xhtml" src="https://mms.businesswire.com/media/20260819307953/en/2878740/4/Picture1.jpg" alt="James Seale (left), general manager at KLA, joins Qnity&#39;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan&#xAE; SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#39;s ongoing investment in advanced semiconductor materials innovation."></img><p xmlns="http://www.w3.org/1999/xhtml" style="font-size:85%;">James Seale (left), general manager at KLA, joins Qnity&#39;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan&#xAE; SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#39;s ongoing investment in advanced semiconductor materials innovation.</p></div><p xmlns="http://www.w3.org/1999/xhtml">
"Developing breakthrough materials for advanced semiconductor technologies requires deep insight into performance and quality at every stage of development and manufacturing," said Julia Woertink, VP of Technology, Semiconductor Technologies, Qnity. "By strengthening how we understand and control quality, we can help our customers push into more advanced nodes with greater confidence and speed."

</p><p xmlns="http://www.w3.org/1999/xhtml">
Installed at Qnity&#39;s New England Manufacturing &amp; Technology Center in Marlborough, Mass., the Surfscan SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> system is part of the company&#39;s broader investment strategy to support advanced semiconductor innovation across its global network. It expands Qnity&#39;s ecosystem of characterization and process control capabilities, helping teams identify sources of variation earlier in materials development and integration.

</p><p xmlns="http://www.w3.org/1999/xhtml">
At advanced nodes, where even small defects can affect device performance, improved understanding of product and process variation supports faster process learning and scale-up for Qnity and its customers. Qnity’s latest investment supports the development and reliable manufacture of <a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="https://cts.businesswire.com/ct/CT?id=smartlink&amp;url=https%3A%2F%2Fwww.qnityelectronics.com%2Fsemiconductor-lithography.html&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=advanced+lithography+materials&amp;index=1&amp;md5=f023b14596548763658fdaa99a6becef" shape="rect">advanced lithography materials</a>, including the Epic<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> photoresist family for ArF lithography, the Eon&#x2122; photoresist family for extreme ultraviolet (EUV) lithography, and enabling underlayer materials.

</p><p xmlns="http://www.w3.org/1999/xhtml">
"Qnity&#39;s investment in the Surfscan SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> system reflects the growing emphasis on characterization and process control across the semiconductor value chain," said James Seale, General Manager, KLA. "Process qualification, monitoring and defect characterization are key enablers for the quality and reliability required in advanced semiconductor applications."

</p><p xmlns="http://www.w3.org/1999/xhtml">
<b xmlns="http://www.w3.org/1999/xhtml">About Qnity
<br xmlns="http://www.w3.org/1999/xhtml"></br></b>Qnity is a premier technology provider across the semiconductor value chain, empowering AI, high performance computing, and advanced connectivity. From groundbreaking solutions for semiconductor chip manufacturing, to enabling high-speed transmission within complex electronic systems, our high-performance materials and integration expertise make tomorrow’s technologies possible. More information about the company, its businesses and solutions can be found at <a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="https://cts.businesswire.com/ct/CT?id=smartlink&amp;url=http%3A%2F%2Fwww.qnityelectronics.com&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=www.qnityelectronics.com&amp;index=2&amp;md5=09a387c160e4d458c9357b146780fe6a" shape="rect">www.qnityelectronics.com</a>.

</p><p xmlns="http://www.w3.org/1999/xhtml">
Qnity&#x2122; and the Qnity Node Logo are trademarks or registered trademarks of affiliates of Qnity Electronics, Inc. Surfscan<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> is a registered trademark of KLA Corporation.

</p><p xmlns="http://www.w3.org/1999/xhtml"><img xmlns="http://www.w3.org/1999/xhtml" alt="" src="https://cts.businesswire.com/ct/CT?id=bwnews&amp;sty=20260819307953r1&amp;sid=benz2&amp;distro=nx&amp;lang=en" style="width:0;height:0"></img><span xmlns="http://www.w3.org/1999/xhtml" class="bwct31415"></span></p><p xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink"><span xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink-phrase">View source version on businesswire.com: </span><span xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink-link"><a xmlns="http://www.w3.org/1999/xhtml" href="https://www.businesswire.com/news/home/20260819307953/en/" rel="nofollow">https://www.businesswire.com/news/home/20260819307953/en/</a></span></p><p xmlns="http://www.w3.org/1999/xhtml">
<b xmlns="http://www.w3.org/1999/xhtml">Media Contact 
</b><br xmlns="http://www.w3.org/1999/xhtml"></br>Ashley Boucher
<br xmlns="http://www.w3.org/1999/xhtml"></br><a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="mailto:ashley.boucher@qnityelectronics.com" shape="rect">ashley.boucher@qnityelectronics.com</a>

</p>

Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities

Qnity Deploys KLA Surfscan SP7XP to boost advanced lithography materials development capabilities

<section class="insight" data-version="1">
  <section data-block="information">
    <h3>Information</h3>
    <p>Investment sharpens process control from materials development through manufacturing


Qnity Electronics, Inc. (&amp;#34;Qnity&amp;#34;) (NYSE:Q), a premier technology solutions leader across the semiconductor value chain,</p>
  </section>

  <section data-block="ai-summary-paragraph">
    <h3>AI Summary</h3>
    <p>Qnity Electronics announced the installation of KLA&#039;s Surfscan SP7XP defect inspection system at its Marlborough, MA facility, as part of expanding its semiconductor materials initiative. The upgrade aims to improve defect characterization and process control across development and manufacturing, reinforcing Qnity&#039;s ability to deliver Epic photoresist for ArF and Eon EUV lithography.</p>
  </section>

  <section data-block="ai-summary-bullets">
    <h3>Key Points</h3>
    <ul><li>Qnity installs KLA Surfscan SP7XP at Marlborough facility.</li><li>System improves wafer defect inspection and process control across development.</li><li>Focus on Epic/Eon lithography materials and underlayer materials.</li><li>Marlborough, MA site expands advanced lithography materials program.</li></ul>
  </section>

  <section data-block="companies-mentioned">
    <h3>Companies Mentioned</h3>
    <ul><li><strong>Qnity Electronics, Inc. (Q)</strong>: Primary beneficiary; installation strengthens materials development and process control.</li><li><strong>KLA Corporation (KLAC)</strong>: Supplier of Surfscan SP7XP; validates Qnity&#039;s capability to invest in inspection tech.</li></ul>
  </section>

  <section data-block="category">
    <h3>Industry News</h3>
    <p>Industry News: describes a corporate-capital expenditure to advance semiconductor materials development and manufacturing capabilities.</p>
  </section>

  <section data-block="market-moving">
    <h3>Market-Moving</h3>
    <ul><li>Surfscan SP7XP installation enhances defect inspection, improving early-process learning across development and manufacturing.</li><li>Capex-focused capability upgrade could strengthen customer roadmaps and potential contract opportunities.</li><li>No disclosed terms; stock reaction may be modest until revenue or margin impact is shown.</li></ul>
  </section>

  <section data-block="key-facts">
    <h3>Key Facts</h3>
    <ul><li>Qnity Electronics (Q) installed Surfscan SP7XP unpatterned wafer defect inspection system from KLA.</li><li>Installation located at Qnity New England Manufacturing &amp; Technology Center, Marlborough, MA.</li><li>Announcement date: August 19, 2026; press release on Business Wire.</li><li>System supports development of advanced lithography materials, including Epic and Eon photoresists.</li><li>Qnity emphasizes process control and variation reduction across materials development.</li></ul>
  </section>

  <section data-block="trading-thesis">
    <h3>Trading Thesis</h3>
    <p>Bullish over the next 6–12 months as process-control gains may unlock higher-value contracts.</p>
  </section>
</section>


<p xmlns="http://www.w3.org/1999/xhtml" class="bwalignc">
<i xmlns="http://www.w3.org/1999/xhtml">Investment sharpens process control from materials development through manufacturing</i>

</p><p xmlns="http://www.w3.org/1999/xhtml">
Qnity Electronics, Inc. ("Qnity") (NYSE:<a class="ticker" href="https://www.benzinga.com/quote/Q">Q</a>), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#39;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps.

</p><p xmlns="http://www.w3.org/1999/xhtml" id="news-body-cta">This press release features multimedia. View the full release here: <a xmlns="http://www.w3.org/1999/xhtml" href="https://www.businesswire.com/news/home/20260819307953/en/" rel="nofollow">https://www.businesswire.com/news/home/20260819307953/en/</a></p><div xmlns="http://www.w3.org/1999/xhtml" id="bwbodyimg" style="width: 480px; float:left; padding-left:0px; padding-right:20px; padding-top:0px; padding-bottom:0px;"><img xmlns="http://www.w3.org/1999/xhtml" src="https://mms.businesswire.com/media/20260819307953/en/2878740/4/Picture1.jpg" alt="James Seale (left), general manager at KLA, joins Qnity&#39;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan&#xAE; SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#39;s ongoing investment in advanced semiconductor materials innovation."></img><p xmlns="http://www.w3.org/1999/xhtml" style="font-size:85%;">James Seale (left), general manager at KLA, joins Qnity&#39;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan&#xAE; SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#39;s ongoing investment in advanced semiconductor materials innovation.</p></div><p xmlns="http://www.w3.org/1999/xhtml">
"Developing breakthrough materials for advanced semiconductor technologies requires deep insight into performance and quality at every stage of development and manufacturing," said Julia Woertink, VP of Technology, Semiconductor Technologies, Qnity. "By strengthening how we understand and control quality, we can help our customers push into more advanced nodes with greater confidence and speed."

</p><p xmlns="http://www.w3.org/1999/xhtml">
Installed at Qnity&#39;s New England Manufacturing &amp; Technology Center in Marlborough, Mass., the Surfscan SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> system is part of the company&#39;s broader investment strategy to support advanced semiconductor innovation across its global network. It expands Qnity&#39;s ecosystem of characterization and process control capabilities, helping teams identify sources of variation earlier in materials development and integration.

</p><p xmlns="http://www.w3.org/1999/xhtml">
At advanced nodes, where even small defects can affect device performance, improved understanding of product and process variation supports faster process learning and scale-up for Qnity and its customers. Qnity’s latest investment supports the development and reliable manufacture of <a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="https://cts.businesswire.com/ct/CT?id=smartlink&amp;url=https%3A%2F%2Fwww.qnityelectronics.com%2Fsemiconductor-lithography.html&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=advanced+lithography+materials&amp;index=1&amp;md5=f023b14596548763658fdaa99a6becef" shape="rect">advanced lithography materials</a>, including the Epic<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> photoresist family for ArF lithography, the Eon&#x2122; photoresist family for extreme ultraviolet (EUV) lithography, and enabling underlayer materials.

</p><p xmlns="http://www.w3.org/1999/xhtml">
"Qnity&#39;s investment in the Surfscan SP7<sup xmlns="http://www.w3.org/1999/xhtml">XP</sup> system reflects the growing emphasis on characterization and process control across the semiconductor value chain," said James Seale, General Manager, KLA. "Process qualification, monitoring and defect characterization are key enablers for the quality and reliability required in advanced semiconductor applications."

</p><p xmlns="http://www.w3.org/1999/xhtml">
<b xmlns="http://www.w3.org/1999/xhtml">About Qnity
<br xmlns="http://www.w3.org/1999/xhtml"></br></b>Qnity is a premier technology provider across the semiconductor value chain, empowering AI, high performance computing, and advanced connectivity. From groundbreaking solutions for semiconductor chip manufacturing, to enabling high-speed transmission within complex electronic systems, our high-performance materials and integration expertise make tomorrow’s technologies possible. More information about the company, its businesses and solutions can be found at <a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="https://cts.businesswire.com/ct/CT?id=smartlink&amp;url=http%3A%2F%2Fwww.qnityelectronics.com&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=www.qnityelectronics.com&amp;index=2&amp;md5=09a387c160e4d458c9357b146780fe6a" shape="rect">www.qnityelectronics.com</a>.

</p><p xmlns="http://www.w3.org/1999/xhtml">
Qnity&#x2122; and the Qnity Node Logo are trademarks or registered trademarks of affiliates of Qnity Electronics, Inc. Surfscan<sup xmlns="http://www.w3.org/1999/xhtml">&#xAE;</sup> is a registered trademark of KLA Corporation.

</p><p xmlns="http://www.w3.org/1999/xhtml"><img xmlns="http://www.w3.org/1999/xhtml" alt="" src="https://cts.businesswire.com/ct/CT?id=bwnews&amp;sty=20260819307953r1&amp;sid=benz2&amp;distro=nx&amp;lang=en" style="width:0;height:0"></img><span xmlns="http://www.w3.org/1999/xhtml" class="bwct31415"></span></p><p xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink"><span xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink-phrase">View source version on businesswire.com: </span><span xmlns="http://www.w3.org/1999/xhtml" id="mmgallerylink-link"><a xmlns="http://www.w3.org/1999/xhtml" href="https://www.businesswire.com/news/home/20260819307953/en/" rel="nofollow">https://www.businesswire.com/news/home/20260819307953/en/</a></span></p><p xmlns="http://www.w3.org/1999/xhtml">
<b xmlns="http://www.w3.org/1999/xhtml">Media Contact 
</b><br xmlns="http://www.w3.org/1999/xhtml"></br>Ashley Boucher
<br xmlns="http://www.w3.org/1999/xhtml"></br><a xmlns="http://www.w3.org/1999/xhtml" rel="nofollow" href="mailto:ashley.boucher@qnityelectronics.com" shape="rect">ashley.boucher@qnityelectronics.com</a>

</p>

Qnity Electronics announced the installation of KLA's Surfscan SP7XP defect inspection system at its Marlborough, MA facility, as part of expanding its semiconductor materials initiative. The upgrade aims to improve defect characterization and process control across development and manufacturing, reinforcing Qnity's ability to deliver Epic photoresist for ArF and Eon EUV lithography.

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Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities

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